| commit | 6024cceed6a018d6722e96d5440ca43f68e1dcd6 | [log] [tgz] |
|---|---|---|
| author | k.kedron <k.kedron@partner.samsung.com> | Wed Jun 05 13:48:01 2019 +0200 |
| committer | Ofir Sonsino <ofir.sonsino@intl.att.com> | Mon Jun 17 07:16:03 2019 +0000 |
| tree | e4ab61fd2b41cb92d06abca334aadff4d5913ac0 | |
| parent | 4b1861c863570af103e0c070e8834f97dfc35075 [diff] |
Improve the test coverage of OnapLoggerAudit and fix log method in OnapLoogerBase. Improve the unit test in OnapLoggerAudit and OnapLoogerBase. Fix the log method for DEBUG LogLevel. Issue-ID: SDC-2327 Signed-off-by: Krystian Kedron <k.kedron@partner.samsung.com> Change-Id: Iff9773dbf108020accd9f65ea89b9cdcb1dd2c0e