| commit | a5b875badca6bc73d18d609a91cdfddfb5a0f396 | [log] [tgz] |
|---|---|---|
| author | k.kedron <k.kedron@partner.samsung.com> | Tue Jun 18 09:24:41 2019 +0200 |
| committer | Ofir Sonsino <ofir.sonsino@intl.att.com> | Sun Jun 23 10:00:22 2019 +0000 |
| tree | 2fab10de2f35b1cb2bbec4c48f06eff11dfb3344 | |
| parent | bbb56de1b8f5ab2322fea0a7537bfe1b9c23a366 [diff] |
Improved unit tests for onaplog package. Added new tests to OnapLoggerDebug, OnapLoggerError and OnapLoggerMetric test. Updated unit tests for the OnapLoggerAudit and OnapLoggerGeneric. Issue-ID: SDC-2327 Signed-off-by: Krystian Kedron <k.kedron@partner.samsung.com> Change-Id: Icc6fa07fd9b91be0b441956df9f01a9bff9b5723